ZDE - Teste

DESIGN &PRODUCTS
SPECIAL FOCUS:
TEST & MEASUREMENT
Fundamentals and measurement
techniques for phase change memory
By Alexander Pronin
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Alexander Pronin ([email protected]) is lead
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applications engineer at Keithley Instruments Inc.
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PHASE CHANGE MEMORY
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TOP ELECTRODE
April 2010 Electronic Engineering Times Europe29
DESIGN & PRODUCTS
SPECIAL FOCUS:
TEST & MEASUREMENT
1.E+06
1.E+05
Current (mA)
Resistance (Ohms)
1.E+07
1.E+04
1.E+03
Current (mA)
Fig 2: RI curve in red.
Voltage (V)
Fig 3: Pulse sequence for creating an RI curve. The tall red curves
are RESET pulses. The shorter red pulses are SET pulses. The short
rectangular black pulses are the resistance (R) measurements.
VAPPLIED
PULSE GEN
SCOPE
RLOAD
IDEV
Active
Probe
PRAM
VDEV
Fig 5: Standard R-Load technique.
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REMOTE
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Critical parameters
PRAM
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Fig 6: Current-limiting technique employed with Model 4225-PMU.
30
Electronic Engineering Times EuropeApril 2010
Fig 4: Example of I-V current voltage sweep [3].
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International Exhibition
& Conference for
POWER ELECTRONICS
INTELLIGENT MOTION
POWER QUALITY
4 – 6 May 2010
2010
Exhibition Centre Nuremberg
Powerful
This is the right place for you!
Mesago PCIM GmbH
–
0711 61946-56
–
[email protected]
April 2010 Electronic Engineering Times Europe31
DESIGN & PRODUCTS
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32
Electronic Engineering Times EuropeApril 2010
Twelve things you didn’t
know a scope could do
By Randy White
THIS ESSENTIAL
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1. Protocol decode
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Randy White ([email protected]) is
technical marketing manager, serial applications at Tektronix Inc.
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