(dobré i špatné) sigma-konjugovaných polysilylenů.

(dobré i špatné) sigma-konjugovaných polysilylenů.

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F. Schauer
Fakulta chemická VUT
skupina fyziky
O. Salyk, M. Weiter, I. Kuitka , N. Dokoupil,
02WHYHOa P. Horváth
Polysilyleny þHVN\– polysilylenes (anglicky)
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2. Chemie 1D-'NHPtNX
Silicons with different dimensionality
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Garrelt P. vandder Laan, et al, Charge Carrier Mobilities in Sutbstiuted
Polysilylenes: Influence of Backbone Conformation,
J.Phys. Chem. 100 (1996),5470
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S. Nespurek, F. Schauer, and A. Kadashchuk : Visible Photoluminescence in Polysilanes, Chemical Monthly 132(2001),159-168,
Fotoelektronové spektroskopie
H e II
Intensity [ a.u.]
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400
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600
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15
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Fig. 2: A survey XPS spectrum from the pristine PMPSi; mind the absence of oxygen related lines [4]
Fig.3: UV induced valence band spectra of the pristine PMPSi surface (A) and after (D1) and (D2) degradation steps using Xe I resonant irradiation [4]
[4] J. Zemek, P. Jiricek, N. Dokoupil, F. Schauer, S. Nespurek: Electron spectroscopy of poly [methyl-phenylsilylene] films, to be published 2002.
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P.Horvath, F.Schauer, I.Kuritka, O.Salyk, M.Weiter, N.Dokoupil, S.Nespurek and V. Fidler: Luminescence in organic silicons prepared from organic
precursors in plasma discharges, Chemical Monthly 132(2001),177-184 ,
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F. Schauer, I. Kuritka, N. Dokoupil and P. Horvath: Nanostructural effects in plasmatically prepared polysilylanes , to be published in Physica E, 2002
5.
Degradace, metastabilita
vs fotorezisty
degradation at
= 325 nm
80000
emission spectra:
λexc =325 nm
C H3
60000
-1
counts [s ]
Si
n
40000
20000
t deg
0
350
400
= 5, 10, 25, 40, 50 min
450
500
550
600
650
Degradation of luminescence in
PMPSi
photoluminescence
emission spectra:
λexc =350nm
sample A4
-1
counts [s ]
60000
t=0
t=15 min
t=30 min
t=45 min
40000
20000
0
350
400
450
500
550
600
650
Degradation of luminescence in PMPSi
A. Kadashchuk, S. Nespurek, N.Ostapenko, Yu. Skryshevskii and V. Zaika: Mol. Cryst.Liq. Cryst. 355(2001),413
Degradation of transport in PMPSi
R. Handlí, F. Schauer, S.Nešp$rek, I. Kuitka, M. Weiter, and P.Schauer:
beam, J. Non-Crystall. Solids (Hol.)227-230 (1998),669,
Meta- stability in poly( methylsilylene) induced by UV radiation and electron
Degradation of kathodoluminescence in PMPSi
R. Handlí, F. Schauer, S.Nešp$rek, I. Kuitka, M. Weiter, and P.Schauer:
beam, J. Non-Crystall. Solids (Hol.)227-230 (1998),669,
Meta- stability in poly( methylsilylene) induced by UV radiation and electron
Molecular weight degradation in PMPSi
Degradation of
PMPSi
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Nanostructural model
photoluminescence
emission spectra:
=350nm
λexc
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counts ][s
sample A4
60000
t=0
t=15 min
t=30 min
t=45 min
40000
20000
0 350
400
450
500
550
600
650
Nanostructural model
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